Auxillary port expands capabilities of ultra fast framing camera




Specialised Imaging has announced a new version of its SIM Ultra Fast Framing Camera that includes an integral auxillary port enabling the system to be interfaced with high speed video, streak cameras, mass spectrometers or time resolved spectrometers.



Incorporating a supplementary optical port, that uses a beamsplitter to deliver 50% of the primary image to a secondary image plane, allowing secondary instruments to share the same optical axis, thereby providing true undistorted datasets for simultaneous data measurement.



Recording simultaneous ultra fast two-dimensional and time-resolved images is of significant interest to scientists in a growing number of fields of study including detonics, cavitation, plasma, and material science because the user can now accurately correlate the events with different type of optical instruments to analyse processes that happens during or after the initial event captured by the SIM.



The camera is capable of scanning up to 1 billion frames/second. A novel optical periscope for focus adjustment enables rapid and simple experimental set-up and optimisation.

Comprehensive triggering facilities, highly accurate timing control, and a wide range of output signals, coupled with a software package that includes full measurement and image enhancement functions simplifies image capture.

Full remote operation using Ethernet connectivity comes as standard enabling the SIM to be easily integrated into almost any environment.

Unlike many traditional ultra fast framing cameras the optical design of the SIM provides the choice of up to 16 separate optical channels without compromising performance or image quality.

Effects such as parallax and shading, inherent in other designs, are eliminated and the high spatial resolution (>36lp/mm) is the same from frame to frame and in both axes. Individual ultra-high resolution intensified CCD detectors, controlled by electronics, offer almost infinite control over gain and exposure allowing researchers total freedom to capture images of even the most difficult transient phenomena.



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