Scientific Instruments company Jeol has launched the benchtop scanning electron microscope (SEM) JCM-7000Plus.
Benchtop scanning electron microscopes are increasingly being used across fields including pharmaceutical development. In the JCM-7000Plus, Jeol expanded the landing voltage to 20kV. This improves resolution to 6nm, enabling measurements at higher magnification and with high resolution.
On the software side, the new microscope retains the GUI of the current JCM-7000. This includes Zeromag, which enables a smooth transition from optical imaging to SEM observation. It also includes the Live Analysis function, which allows real-time elemental analysis during observation. JCM-7000Plus also features the advanced automation feature Neo Action.
Jeol has also added two new features: Live Particle, which automatically measures particle size and count in real time while observing; and Live Report, which automatically acquires data and generates reports while moving the field of view. These features simplify routine tasks to become more intuitive and efficient.
Jeol also recently launched two high-resolution microscopes as well as the atomic resolution microscope Grand Arm 3.
