Pfeiffer Vacuum+Fab Solutions will exhibit contamination management and gas abatement technologies at SEMICON India 2026.
Through 3D models, visitors can explore technologies for measuring, controlling and cleaning airborne molecular contamination.
The ambient multi-port controller (AMPC), for example, enables manufacturers to monitor and analyse contamination data, which can be transmitted to fab control software for better process control and optimization.
The APA pod analyser detects contamination to improve FOUP cleaning efficiency, maximize wafer yield, manage wafer Q-Time, pinpoint the sources of defects, and maintain contamination control throughout cleanroom operations.
Visitors can also interact with the semiconductor fab touch screen, which offers a virtual tour through a modern semiconductor manufacturing facility. It demonstrates where technologies are deployed through the production process, including the use of cleanroom environments.
SEMICON India 2026 takes place 17-19 September Yashobhoomi (IICC) in New Delhi. For more information about upcoming cleanroom events click here.
