Scientific Instruments company Jeol has recently launched the 300kV atomic resolution analytical microscope Grand Arm 3.
Aberration correctors, large aperture STEM corrector and advanced TEM corrector are installed in the Grand Arm 3. It operates under larger aperture angles than conventional models, resulting in ultra-high resolution observation and analysis.
The integration of a high-speed scan system into the Grand Arm 3 enables the acquisition of STEM images of at least 30 frames per second. This could be useful for in-situ atomic-level observation and analysis of dynamic phenomena, which are traditionally difficult to study using STEM.
Lascor, the STEM aberration corrector, uses a three-stage hexapole aberration-correction electron optical system to expand the aberration-corrected area on Ronchigram in STEM mode. This makes it possible to perform observations at large convergence semi-angles and obtain high-resolution STEM images with reduced diffraction limits.
Additionally, as the focal depth becomes shallower when the convergence semi-angle expands, it is possible to perform depth profiling of the specimen with high resolution by performing STEM observation while changing the focal length of the object lens in minute increments.
The advanced TEM corrector uses an optimised, two-stage hexapole aberration-correction electron optical system to correct six-fold astigmatism. This allows electrons scattered at wider angles to contribute to imaging without being affected by aberration. In diffraction mode, the effect of aberration on electrons scattered at wide angles is reduced, so it is possible to obtain diffraction figures with suppressed distortion.
The EDS analysis system features a 158 mm² dual SDD, providing high X-ray detection efficiency, and enabling fast EDS analysis using high resolution observation probes.
The combination of a dedicated scan coil and a scintillator with a short attenuation time realizes STEM observation at 30 frames or more per second.
Recently, Jeol also releases the CRYO ARM 300S and CRYO ARM 200S, 300kV and 200kV cold field-emission cryo-electron microscopes.
