The system delivers insights into the physical and chemical properties of materials
Horiba, Japanese manufacturer of precision instruments, has launched the SignatureSPM, a scanning probe microscope.
SignatureSPM is a multimodal characterisation system built on an automated atomic force microscopy (AFM) platform and integrated with a Raman/photoluminescence spectrometer.
“The design of SignatureSPM was driven by Horiba’s commitment to develop innovative analytical and automation solutions that address the needs of scientists and researchers,” said Horiba AFM and AFM-Raman product manager Joao-Lucas Rangel.
“The SignatureSPM will enable precise, multimodal measurements, making it a highly relevant tool for cutting-edge research.”
The system offers simultaneous analyses of topographic, mechanical, electrical, magnetic, optical, and chemical data in a single, real-time measurement with less sample handling required.
These simultaneous colocalised measurements deliver insights into the physical and chemical properties of materials as well as their functionality. Precise spatial correlation between different data types is particularly useful for materials science, chemistry, biology and life sciences.
Faster colocalised data acquisition helps to streamline workflow and provide results in less time.
Chemical identification is enhanced due to SignatureSPM’s combination of AFM with Raman and photoluminescence spectroscopy. This combination, providing stability and speed, is especially suitable for nanotechnology research and material characterisation.
The system’s SmartSPM software incorporates an AFM scanner, NIR feedback laser, full automation of AFM probe alignment, tip approach and AFM feedback optimisation, including the dynamic scan rate adjustment without image distortion.
SignatureSPM’s AFM can perform large scans and molecular resolution. High scanning speeds and high-resolution imaging is possible, even during online speed changes, due to control algorithms supported by a digital controller.
The scans prioritise stability through fast response time, low noise, low drift and metrological traceability.
NIR feedback allows true light-on/light-off measurements for photosensitive materials.
