Company Information
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Magnetic Force Microscopy (MFM) image of ferrite garnet film. Scan size 100x100 µm. 2048x2048 points.
AIST-NT
www.aist-nt.com
AIST-NT is a young dynamic company founded by a team of researchers and design engineers in 2007 as a spin-off from NT-MDT. Our main focus is innovative research and development of advanced integrated scanning systems for nanotechnology.
You can learn more about our products below.
SmartSPM - New Generation of Atomic Force Microscopes
Fully automated
SmartSPM can be automatically adjusted before starting measurements.
High speed 100 scanner
(scanner resonant frequencies higher than 7kHz XY & 15kHz Z), capacitive sensors for high linearity & accurate positioning.
1300 nm AFM laser
eliminates interference with VIS light-sensitive biological and semiconductor samples. It also makes it possible to perform simultaneous AFM and fluorescence or Raman scattering measurements without any crosstalk for most popular UV-VIS-NIR (364-830 nm) excitation lasers.
Advanced closed-loop control
with active removal of XY phase lag, overshooting & ringing for high speed scanning.
True non-contact scanning
and extra safe landing procedure.
Digital modular controller
with fast DSP, USB interface and expandable architecture
OmegaScope™ - Confocal Raman / AFM combined system
· AFM integrated with optical spectrometer;
· Direct Top and Side Optical Access for high resolution UV-VIS-NIR confocal, TERS & SERS
experiments;
· Scan-by-Sample and Scan-by-Laser optical imaging;
· Automated exchange of excitation laser;
· Powerful software for AFM and optical data processing.
Full Range Of SPM Accessories
· AFM cantilevers;
· Si test gratings;
· Test samples (HOPG, mica).
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