Science news, opinion, interviews and product reports for scientists across all disciplines. Make Scientist Live my homepage  SciLive on Twitter21st November 2009
eLab - Latest Issue

 View online magazine
 
eFood - Latest Issue

 View online magazine
 

Company Information



Please click an image below to enlarge it:
SmartSPM Scanning Probe Microscope

SmartSPM Scanning Probe Microscope


 
OmegaScope Confocal Raman / AFM combined system (reflection configuration)

OmegaScope Confocal Raman / AFM combined system (reflection configuration)


 
OmegaScope Confocal Raman / AFM combined system (transmission configuration)

OmegaScope Confocal Raman / AFM combined system (transmission configuration)


 
Magnetic Force Microscopy (MFM) image of ferrite garnet film. Scan size 100x100 µm. 2048x2048 points.

Magnetic Force Microscopy (MFM) image of ferrite garnet film. Scan size 100x100 µm. 2048x2048 points.


 
100x100nm Topography scan of C28H58 lamellae on HOPG. Z range is 1.3A

100x100nm Topography scan of C28H58 lamellae on HOPG. Z range is 1.3A


 

AIST-NT

www.aist-nt.com

AIST-NT is a young dynamic company founded by a team of researchers and design engineers in 2007 as a spin-off from NT-MDT. Our main focus is innovative research and development of advanced integrated scanning systems for nanotechnology.

You can learn more about our products below.

SmartSPM - New Generation of Atomic Force Microscopes

Fully automated

SmartSPM can be automatically adjusted before starting measurements.

High speed 100  scanner

(scanner resonant frequencies higher than 7kHz XY & 15kHz Z), capacitive sensors for high linearity & accurate positioning.

1300 nm AFM laser

eliminates interference with VIS light-sensitive biological and semiconductor samples. It also makes it possible to perform simultaneous AFM and fluorescence or Raman scattering measurements without any crosstalk for most popular UV-VIS-NIR (364-830 nm) excitation lasers.

Advanced closed-loop control

with active removal of XY phase lag, overshooting & ringing for high speed scanning.

True non-contact scanning

and extra safe landing procedure.

Digital modular controller

with fast DSP, USB interface and expandable architecture

OmegaScope™ - Confocal Raman / AFM combined system

·       AFM integrated with optical spectrometer;

·       Direct Top and Side Optical Access for high resolution UV-VIS-NIR confocal, TERS & SERS

        experiments;

·       Scan-by-Sample and Scan-by-Laser optical imaging;

·       Automated exchange of excitation laser;

·       Powerful software for AFM and optical data processing.

Full Range Of SPM Accessories

·       AFM cantilevers;

·       Si test gratings;

·       Test samples (HOPG, mica).

 
View All Services »
 

©2008 Setform Limited

Site By OWB